Scanning Electron Microscope

The Scanning Electron Microscope (SEM) has a large depth of field, which allows a large amount of the sample to be in focus at one time.

The SEM also produces images of high resolution, which means that closely spaced features can be examined at a high magnification. Preparation of the samples is relatively easy since most SEM's ony require the sample to be conductive.

The combination of higher magnification, larger depth of focus, greater resolution, and ease of sample observation makes the SEM one of the most heavily used instruments in research areas today.