Our
optical system produces accurate images of extremely
large object fields. The objectives are plan achromates
and plan fluorites for infinite tube lengths and have a
high brilliance, resolution and flatness of field.
Standard, long working distance (LWD) and extra-long
working distance (XLWD) objectives are available. With
x10 widefield eyepieces the viewing angle is 51°. The
range of magifications available is 16x to 2000x and
complies with DIN and ASTM standards. |
Illumination is provided by a 100 Watt halogen lamp with
a colour temperature of 3200K. |
The
following modules are available:
-
Brightfield
-
Darkfield
-
Polarised light
-
Interference contrast
- Epi-fluorescence
Photographic System
-
Polaroid 4" x 5" camera
-
Nikon Coolpix 995 camera
|
|
Dual
Reflex Module
The dual
reflex module is an optical beam splitter which can be
used for:
|
ASTM E3-01 |
Standard
Practice for Preparation of Metallographic Specimens |
ASTM E7-00 |
Standard
Terminology Relating to Metallography |
ASTM
E45-97e2 |
Standard
Test Methods for Determining the Inclusion Content of
Steel |
ASTM
E-112-96e1 |
Standard
Test Methods for Determining Average Grain Size |
ASTM
E175-82(1999)e1 |
Standard
Terminology of Microscopy |
ASTM
E-340-00 |
Standard
Test Method for Macroetching Metals and Alloys |
ASTM
E381-01 |
Standard
Method of Macroetch Testing Steel Bars, Billets, Blooms,
and Forgings |
ASTM E-407-99 |
Standard
Practice for Microetching Metals and Alloys |
ASTM
E562-99e1 |
Standard
Test Method for Determining Volume Fraction by
Systematic Manual Point Count |
ASTM
E768-99 |
Standard
Practice for Preparing and Evaluating Specimens for
Automatic Inclusion Assessment of Steel |
ASTM
E883-99 |
Standard
Guide for Reflected-Light Photomicrography |
ASTM
E930-99 |
Standard
Test Methods for Estimating the Largest Grain Observed
in a Metallographic Section (ALA Grain Size) |
ASTM
E1122-96 |
Standard
Practice for Obtaining JK Inclusion Ratings Using
Automatic Image Analysis |
ASTM
E1180-94(1998) |
Standard
Practice for Preparing Sulfur Prints for Macrostructural
Examination |
ASTM
E1181-87(1998)e1 |
Standard
Test Methods for Characterizing Duplex Grain Sizes |
ASTM
E1182-93(1998) |
Standard
Test Method for Measurement of Surface Layer Thickness
by Radial Sectioning |
ASTM
E1245-00 |
Standard
Practice for Determining the Inclusion or Second-Phase
Constituent Content of Metals by Automatic Image
Analysis |
ASTM
E1268-99 |
Standard
Practice for Assessing the Degree of Banding or
Orientation of Microstructures |
ASTM
E1382-97 |
Standard
Test Methods for Determining Average Grain Size Using
Semiautomatic and Automatic Image Analysis |
ASTM
E1558-99 |
Standard
Guide for Electrolytic Polishing of Metallographic
Specimens |